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FLYING PROBE TESTER FA1815-20 HIOKI
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FLYING PROBE TESTER FA1815-20 HIOKI

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  • 4 independent probing arms
  • Max. 4,000,000 test steps
  • 0.1 μm XY resolution
  • Max. 100 points/sec
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FLYING PROBE TESTER FA1116 HIOKI
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FLYING PROBE TESTER FA1116 HIOKI

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  • Capacitance Testing Optimized
  • Vacuum-Clamp Method
  • Reduced-Impact Probes
  • Gerber Data Software
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