FLYING PROBE TESTER FA1815-20 HIOKI
- 4 independent probing arms
- Max. 4,000,000 test steps
- 0.1 μm XY resolution
- Max. 100 points/sec
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Description
Unveiling the Hioki FA1220 Flying Probe Tester
In the incredibly intricate and demanding landscape of modern electronics manufacturing, particularly for complex printed circuit boards (PCBs) and component-embedded boards, the need for uncompromising accuracy and speed in testing is paramount. The Hioki FA1220 Flying Probe Tester stands as a pinnacle of automated inspection, meticulously engineered to detect even the most minute defects without the need for cumbersome custom fixtures. This advanced system revolutionizes PCB and substrate testing by deploying four independent arms (two each, top and bottom), allowing for highly efficient and precise probing. Capable of executing an astonishing 4,000,000 test steps, the FA1220 offers an unparalleled depth of inspection, ensuring the highest quality standards for both bare boards and those populated with intricate components. Its versatile design and robust capabilities make it an indispensable tool for manufacturers striving for zero-defect production in a fast-paced environment.
Comprehensive Test Parameters and Ranges
The FA1220 is equipped with an incredibly comprehensive suite of test parameters and measurement ranges, making it a truly versatile solution for diverse testing requirements. For basic electrical integrity, it performs DC constant-current continuity measurement from 400.0 mΩ to 1.000 kΩ and DC constant-current resistance measurement from an ultra-sensitive 40.00 $\mu$$\Omega$ to 400.0 kΩ. It also handles DC constant-voltage resistance measurement from 4.000 to 40.00 MΩ. Insulation integrity is addressed with insulation resistance measurement (1.000 kΩ to 100.0 GΩ) and low voltage insulation resistance measurement (1.000 MΩ to 100.0 GΩ). For component characterization, it offers AC constant-voltage capacitance measurement from 100.0 fF to 10.00 F and leakage current measurement from 1.000 A to 100.0 mA. Further capabilities include high-voltage resistance measurement (1.000 kΩ to 100.0 GΩ), capacitor insulation measurement (1.000 kΩ to 250.0 MΩ), and essential open and short measurements. This broad spectrum ensures thorough electrical verification of any board.
Specialized Component-Embedded Board Tests
Beyond traditional bare board testing, the Hioki FA1220 truly excels in specialized component-embedded board tests, a critical capability for advanced electronic assemblies. As modern designs increasingly integrate components directly within the layers of a PCB, standard testing methods become insufficient. The FA1220 addresses this with dedicated parameters, including LSI connection tests (0.000 V to 12.00 V), vital for verifying the integrity of complex integrated circuit connections. It also offers precise AC constant-voltage resistance measurement (10.00 to 10.00 k$\Omega$), AC constant-voltage capacitance measurement (10.00 pF to 100.0 F), and AC constant-voltage inductance measurement (1.000 H to 1.000 mH) specifically tailored for embedded components. This robust set of tests allows manufacturers to thoroughly vet the functionality and integrity of internal components, ensuring that even hidden elements of the board meet design specifications. This capability is indispensable for the production of high-density, high-performance electronics found in critical applications like automotive, medical, and aerospace industries.
Unparalleled Precision and Speed in Probing
The Hioki FA1220 sets a new benchmark for unparalleled precision and speed in probing, crucial for the demanding requirements of micro-electronics manufacturing. Its movement resolution is exceptionally fine, achieving 0.1 m/pulse in XY-axes and 1 m/pulse in the Z-axis, allowing the probes to accurately target even the smallest and most densely packed test points. This precision enables the FA1220 to handle boards with an incredibly small minimum pad pitch of 34 m on the top surface and 44 m on the bottom surface (when using CP1075-09 probes). Furthermore, it can confidently test pads with a minimum size of 4 m square on the top surface and 14 m square on the bottom surface (again, with CP1075-09 probes). Despite this microscopic precision, the FA1220 maintains an astounding measurement speed of max. 100 points/sec. (with 0.15 mm movements and 4-arm simultaneous probing for capacitance measurement), delivering both accuracy and high throughput for demanding production lines.
Flexible Clamp Methods and Board Compatibility
The Hioki FA1220 is designed for maximum operational flexibility, supporting various flexible clamp methods and broad board compatibility. It utilizes a Flexible Fixture as its primary clamping mechanism, providing robust and adaptable support for a wide range of PCB sizes and shapes. For highly sensitive capacitance measurements that require optimal stability and reduced environmental interference, an optional Vacuum Unit for Capacitance Test is available, ensuring the most precise and repeatable results. The tester accommodates a wide range of board dimensions: thickness from 1 mm (0.04 in.) to 12 mm (0.47 in.). For outer dimensions, it supports boards from a compact 50 mm (1.97 in.) W × 50 mm (1.97 in.) D up to a substantial 340 mm (13.39 in.) W × 340 mm (13.39 in.) D, covering a vast majority of typical PCB sizes. The maximum testable area is also generously specified at 340 mm (13.39 in.) W × 340 mm (13.39 in.) D, ensuring that even large, complex boards can be fully inspected with high precision.
Diverse Applications in Electronics Manufacturing
The Hioki FA1220 Flying Probe Tester’s advanced capabilities make it an indispensable asset across a diverse range of applications in electronics manufacturing. In bare board fabrication, it is critical for verifying circuit integrity, ensuring opens, shorts, and correct resistance values before component assembly, preventing costly rework. For component-embedded boards, its specialized tests for LSI connections and embedded LCR components are crucial for validating the complex internal structures, essential for high-density automotive, medical, and aerospace electronics. In contract manufacturing (EMS), its flexibility allows for rapid setup and testing of various board designs without the overhead of custom fixtures, significantly reducing time-to-market. For prototyping and R&D, the FA1220 provides quick and comprehensive validation of new board designs, identifying flaws early in the development cycle. Its high precision and speed also make it ideal for small to medium volume production where fixture costs are prohibitive, offering a cost-effective and highly accurate alternative.
Japanese Precision Engineering and Support
The Hioki FA1220 Flying Probe Tester is a proud embodiment of Japanese precision engineering and unwavering support. All critical processes, from the initial stages of concept development and meticulous design to the final stages of manufacturing for almost all Hioki measuring instruments, are rigorously carried out at their Head Office in Nagano Prefecture, Japan. This vertically integrated approach ensures stringent, end-to-end quality control and the application of some of the industry’s most advanced technological capabilities, guaranteeing that every product delivered is of the highest possible quality, accuracy, and unwavering reliability. This dedication to superior craftsmanship is further reinforced by a generous 3-year warranty across their product lines, providing customers with comprehensive, long-term peace of mind and demonstrating Hioki’s profound confidence in the durability, accuracy, and consistent performance of their equipment. This robust guarantee solidifies Hioki instruments as sound and secure investments for any professional.
tpt24: Your Trusted Global Supplier
When making a strategic investment in a sophisticated precision instrument like the Hioki FA1220 Flying Probe Tester, authenticity and guaranteed quality are paramount concerns. This is precisely where tpt24 distinguishes itself as the undisputed premier online store worldwide for this exceptional product. tpt24 is profoundly committed to delivering an unparalleled purchasing experience, underpinned by an unwavering dedication to product integrity and customer satisfaction across the globe. Every Hioki FA1220 acquired from tpt24 is accompanied by an unconditional guarantee of authenticity and superior quality, assuring you that you receive a genuine, meticulously manufactured instrument that adheres to the highest industry standards. Irrespective of your geographical location, tpt24 provides dependable and secure worldwide delivery, bringing this cutting-edge PCB testing device directly to your doorstep, thereby empowering your critical applications with unmatched precision and unwavering confidence.
Specifications
| Number of arms | 4 (2 each, top and bottom) | |
|---|---|---|
| Compatible probes | 1172 series, CP1072 series, CP1073 series | |
| Number of test steps | Max. 4,000,000 steps | |
| Test parameters and measurement ranges | DC constant-current continuity measurement | 400.0 mΩ to 1.000 kΩ |
| DC constant-current resistance measurement | 40.00 μΩ to 400.0 kΩ | |
| DC constant-voltage resistance measurement | 4.000 Ω to 40.00 MΩ | |
| Insulation resistance measurement | 1.000 kΩ to 100.0 GΩ | |
| Low voltage insulation resistance measurement | 1.000 MΩ to 100.0 GΩ | |
| AC constant-voltage capacitance measurement | 100.0 fF to 10.00 μF | |
| Leakage current measurement | 1.000 μA to 100.0 mA | |
| High-voltage resistance measurement | 1.000 kΩ to 100.0 GΩ | |
| Capacitor insulation measurement | 1.000 kΩ to 250.0 MΩ | |
| Open measurement | 4.000 Ω to 4.000 MΩ | |
| Short measurement | 400.0 mΩ to 40.00 kΩ | |
| Test parameters and measurement for component-embedded board tests | LSI connection test | 0.000 V to 12.00 V |
| AC constant-voltage resistance measurement | 10.00 Ω to 10.00 kΩ | |
| AC constant-voltage capacitance measurement | 10.00 pF to 100.0 μF | |
| AC constant-voltage inductance measurement | 1.000 μH to 1.000 mH | |
| Judgment range | -99.9% to +999.9% or absolute value | |
| Movement resolution | XY: 0.1 μm/pulse; Z: 1 μm/pulse | |
| Minimum pad pitch | Top surface: 34 μm (with CP1075-09) Bottom surface: 44 μm (with CP1075-09) |
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| Minimum pad size | Top surface: 4 μm square (with CP1075-09) Bottom surface: 14 μm square (with CP1075-09) |
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| Measurement speed | Max. 100 points/sec. (0.15 mm movements, 4-arm simultaneous probing, capacitance measurement) | |
| Testable board size | Thickness : 1 mm (0.04 in.) to 12 mm (0.47 in.) Outer dimensions : 50 mm (1.97 in.) W × 50 mm (1.97 in.) D to 340 mm (13.39 in.) W × 340 mm (13.39 in.) D |
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| Maximum testable area | 340 mm (13.39 in.) W × 340 mm (13.39 in.) D | |
| Clamp method | Flexible Fixture Vacuum Unit for Capacitance Test (Options) |
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| Air requirements | Primary-side pressure: 0.5 MPa to 0.99 MPa (dry air) Maximum consumption: 0.3 L/min. (ANR) |
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| Power supply | 200 V, 220 V, 230 V, 240 V AC single-phase (specified at time of order); 50/60 Hz; maximum power consumption: 5 kVA |
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| Dimensions and weight | 1355 mm (53.35 in.) W × 1190 mm (46.85 in.) H × 1265mm (49.8 in.) D(excluding protruding parts); 1100 kg ±50 kg (38800 oz. ±1763 oz.) |
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